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J. Tolev, A. Mandelis and M. Pawlak, "On the Non-linear Dependence of Photocarrier Radiometry Signals from Si Wafers on the Intensity of the Laser Beam", Proc. 14th Int. Conf. Photoacoustic & Photothermal Phenomena, January 6 – 9, 2007, European Physical Journal, Special Topics 153, 317 – 320 (2008).