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Non-Contact Measurement of Transport Properties of Long Bulk-Lifetime Si Wafers using Photothermal Radiometry

A. Salnick, A. Mandelis and C. Jean - 1996

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https://cadipt.mie.utoronto.ca/publications/non-contact-measurement-of-transport-properties-of-long-bulk-lifetime-si-wafers-using-photothermal-radiometry/

Citation

A. Salnick, A. Mandelis and C. Jean, "Non-Contact Measurement of Transport Properties of Long Bulk-Lifetime Si Wafers using Photothermal Radiometry", Appl. Phys. Lett. 69 (17), 2522-2524 , October 21, 1996.

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