Permalink to Publication
https://cadipt.mie.utoronto.ca/publications/minority-carrier-lifetime-and-concentration-measurements-on-p-si-wafers-by-infrared-photothermal-radiometry-and-microwave-photoconductance-decay/
Citation
M. E. Rodriguez, A. Mandelis, G. Pan, J. A. Garcia, V. Gorodokin and Y. Raskin, "Minority Carrier Lifetime and Concentration Measurements on p-Si Wafers by Infrared Photothermal Radiometry and Microwave Photoconductance Decay", J. Appl. Phys. 87 (11) 8113 - 8121 (1 June 2000).