Carrier-density-wave transport property depth profilometry using spectroscopic photothermal radiometry of silicon wafers I: Theoretical aspects

https://cadipt.mie.utoronto.ca/publications/carrier-density-wave-transport-property-depth-profilometry-using-spectroscopic-photothermal-radiometry-of-silicon-wafers-i-theoretical-aspects/

D. Shaughnessy and A. Mandelis, "Carrier-density-wave transport property depth profilometry using spectroscopic photothermal radiometry of silicon wafers I: Theoretical aspects", J. Appl. Phys. 93, Number 9, 5236-5243 (1 May 2003).