Permalink to Publication
https://cadipt.mie.utoronto.ca/publications/direct-search-deep-level-photo-thermal-spectroscopy-an-enhanced-reliability-method-for-overlapped-semiconductor-defect-state-characterization/
Citation
J. Xia and A. Mandelis, "Direct Search Deep-Level Photo-Thermal Spectroscopy: An enhanced reliability method for overlapped semiconductor defect-state characterization", Appl. Phys. Lett. 96, 262112 (1 – 3), (2010).