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Minority Carrier Lifetime and Iron Concentration Measurements on p-Si wafers by Infrared Photothermal Radiometry and Microwave Photoconductance Decay

A. Mandelis, M. E. Rodriguez, J. A. Garcia, V. Gorodokin and Y. Riopel - 2001

Permalink to Publication

https://cadipt.mie.utoronto.ca/publications/minority-carrier-lifetime-and-iron-concentration-measurements-on-p-si-wafers-by-infrared-photothermal-radiometry-and-microwave-photoconductance-decay/

Citation

A. Mandelis, M. E. Rodriguez, J. A. Garcia, V. Gorodokin and Y. Riopel, "Minority Carrier Lifetime and Iron Concentration Measurements on p-Si wafers by Infrared Photothermal Radiometry and Microwave Photoconductance Decay", Anal Sci. (J. Japan Soc. Anal. Chem.) 17 (Special Issue), s265 – s268 (2001).

Minority Carrier Lifetime and Iron Concentration Measurements on p-Si wafers by Infrared Photothermal Radiometry and Microwave Photoconductance Decay

A. Mandelis, M. E. Rodriguez, J. A. Garcia, V. Gorodokin and Y. Riopel - 2001

Permalink to Publication

https://cadipt.mie.utoronto.ca/publications/minority-carrier-lifetime-and-iron-concentration-measurements-on-p-si-wafers-by-infrared-photothermal-radiometry-and-microwave-photoconductance-decay/

Citation

A. Mandelis, M. E. Rodriguez, J. A. Garcia, V. Gorodokin and Y. Riopel, "Minority Carrier Lifetime and Iron Concentration Measurements on p-Si wafers by Infrared Photothermal Radiometry and Microwave Photoconductance Decay", Anal Sci. (J. Japan Soc. Anal. Chem.) 17 (Special Issue), s265 – s268 (2001).