Permalink to Publication
https://cadipt.mie.utoronto.ca/publications/photo-carrier-radiometry-of-semiconductors-a-novel-optoelectronic-diffusion-wave-technique-for-silicon-process-ndt/
Citation
A. Mandelis, "Photo-carrier radiometry of semiconductors: a novel optoelectronic diffusion-wave technique for silicon process NDT", Proc. 3rd Int. Conf. On Emerging Technologies in NDT, 26-28 May 2003, Thessaloniki,Greece; (D. van Hemelrijk, A. Anastasopoulos and N. E. Melanitis, Eds. A.A. Balkema Publ. Lisse, 2004), pp. 9 – 17.