Center for Advanced Diffusion-Wave and Photoacoustic Technologies – CADIPT

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II. Novel Non-destructive Imaging and Quantitative Metrologies for Semiconductor Optoelectronic and Nanoscale Device and Material Inspection Using Photocarrier Diffusion Waves

II. Novel Non-destructive Imaging and Quantitative Metrologies for Semiconductor Optoelectronic and Nanoscale Device and Material Inspection Using Photocarrier Diffusion Waves

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← I. Biomedical and Dental Non-Invasive Diagnostic Imaging Techniques and Biosensor Technologies

III. Novel Non-destructive Testing and Imaging Technologies Using Thermal Waves and Laser Ultrasonics →

University of Toronto
Department of Mechanical and Industrial Engineering
5 King's College Road
Toronto, Ontario • M5S 3G8 • Canada