Carrier-Density-Wave Transport and Local Internal Electric Field Measurements in Biased Metal-Oxide-Semiconductor n-Si Devices using Contactless Laser Photo-Carrier Radiometry

https://cadipt.mie.utoronto.ca/publications/carrier-density-wave-transport-and-local-internal-electric-field-measurements-in-biased-metal-oxide-semiconductor-n-si-devices-using-contactless-laser-photo-carrier-radiometry/

A. Mandelis, M. Pawlak and D. Shaughnessy, "Carrier-Density-Wave Transport and Local Internal Electric Field Measurements in Biased Metal-Oxide-Semiconductor n-Si Devices using Contactless Laser Photo-Carrier Radiometry", Semicond. Sci. Technol. 19, 1240 – 1249 (2004).