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J. A. Garcia, X. Guo, A. Mandelis, D. Shaughnessy ,L. Nicolaides, and A. Salnick, "Characterization of Nano-Depth Junctions in Silicon by Using Photo-Carrier Radiometry (PCR)", Proc. 14th Int. Conf. Photoacoustic & Photothermal Phenomena, January 6 – 9, 2007, European Physical Journal, Special Topics 153, 287 – 290 (2008).