Characterization of Nano-Depth Junctions in Silicon by Using Photo-Carrier Radiometry (PCR)

Permalink to Publication

https://cadipt.mie.utoronto.ca/publications/characterization-of-nano-depth-junctions-in-silicon-by-using-photo-carrier-radiometry-pcr/

Citation

J. A. Garcia, X. Guo, A. Mandelis, D. Shaughnessy ,L. Nicolaides, and A. Salnick, "Characterization of Nano-Depth Junctions in Silicon by Using Photo-Carrier Radiometry (PCR)", Proc. 14th Int. Conf. Photoacoustic & Photothermal Phenomena, January 6 – 9, 2007, European Physical Journal, Special Topics 153, 287 – 290 (2008).

Characterization of Nano-Depth Junctions in Silicon by Using Photo-Carrier Radiometry (PCR)

Permalink to Publication

https://cadipt.mie.utoronto.ca/publications/characterization-of-nano-depth-junctions-in-silicon-by-using-photo-carrier-radiometry-pcr/

Citation

J. A. Garcia, X. Guo, A. Mandelis, D. Shaughnessy ,L. Nicolaides, and A. Salnick, "Characterization of Nano-Depth Junctions in Silicon by Using Photo-Carrier Radiometry (PCR)", Proc. 14th Int. Conf. Photoacoustic & Photothermal Phenomena, January 6 – 9, 2007, European Physical Journal, Special Topics 153, 287 – 290 (2008).