Combined Photothermal and Photoacoustic Characterization of Silicon-Epoxy, and the existence of a Particle Percolation Threshold

Permalink to Publication

https://cadipt.mie.utoronto.ca/publications/combined-photothermal-and-photoacoustic-characterization-of-silicon-epoxy-and-the-existence-of-a-particle-percolation-threshold/

Citation

P. J. Mendoza, A. Mandelis, L. Nicolaides, J. Huerta and M. E. Rodriguez, "Combined Photothermal and Photoacoustic Characterization of Silicon-Epoxy, and the existence of a Particle Percolation Threshold", Anal Sci. (J. Japan Soc. Anal. Chem.) 17 (Special Issue), s269 – s272 (2001).

Combined Photothermal and Photoacoustic Characterization of Silicon-Epoxy, and the existence of a Particle Percolation Threshold

Permalink to Publication

https://cadipt.mie.utoronto.ca/publications/combined-photothermal-and-photoacoustic-characterization-of-silicon-epoxy-and-the-existence-of-a-particle-percolation-threshold/

Citation

P. J. Mendoza, A. Mandelis, L. Nicolaides, J. Huerta and M. E. Rodriguez, "Combined Photothermal and Photoacoustic Characterization of Silicon-Epoxy, and the existence of a Particle Percolation Threshold", Anal Sci. (J. Japan Soc. Anal. Chem.) 17 (Special Issue), s269 – s272 (2001).