Computational Aspects of Laser Radiometric Multiparameter Fit for Carrier Transport Property Measurements in Si Wafers

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https://cadipt.mie.utoronto.ca/publications/computational-aspects-of-laser-radiometric-multiparameter-fit-for-carrier-transport-property-measurements-in-si-wafers/

Citation

M. E. Rodriguez, A. Mandelis, G. Pan, L. Nicolaides, J. A. Garcia and Y. Riopel, "Computational Aspects of Laser Radiometric Multiparameter Fit for Carrier Transport Property Measurements in Si Wafers", J. Electrochem. Soc. 147 (2), 687-698 (2000).

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