Depth profile reconstructions of electronic transport properties in H+ MeV-energy ion-implanted n-Si wafers using photocarrier radiometry

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https://cadipt.mie.utoronto.ca/publications/depth-profile-reconstructions-of-electronic-transport-properties-in-h-mev-energy-ion-implanted-n-si-wafers-using-photocarrier-radiometry/

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R. Tai, C-H Wang, J-P Hu and A.Mandelis, "Depth profile reconstructions of electronic transport properties in H+ MeV-energy ion-implanted n-Si wafers using photocarrier radiometry", J. Appl. Phys. 116 (3) 033706 (8 pages) (Jul 21, 2014)

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