Permalink to Publication
https://cadipt.mie.utoronto.ca/publications/detection-of-silicon-wafer-contamination-by-lifetime-measurement-using-infrared-photothermal-radiometry/
Citation
A. Salnick, A. Mandelis and C. Jean, "Detection of Silicon Wafer Contamination by Lifetime Measurement Using Infrared Photothermal Radiometry", Phys. Stat. Solidi (a) Rapid Research Note 163, No. 1, R5-R6, September 1997.