Permalink to Publication
https://cadipt.mie.utoronto.ca/publications/influence-of-vignetting-on-signal-analysis-of-photocarrier-radiometry-of-semiconductor-wafers/
Citation
B. Li, D. Shaughnessy and A. Mandelis, "Influence of vignetting on signal analysis of photocarrier radiometry of semiconductor wafers", Rev. Sci. Instrum. 76, 063703 (1 – 6) (2005).