Permalink to Publication
https://cadipt.mie.utoronto.ca/publications/infrared-photo-carrier-radiometry-of-semiconductors-physical-principles-quantitative-depth-profilometry-and-scanning-imaging-of-deep-sub-surface-electronic-defects/
Citation
A. Mandelis, J. Batista and D. Shaughnessy, "Infrared photo-carrier radiometry of semiconductors: Physical principles, quantitative depth profilometry and scanning imaging of deep sub-surface electronic defects", Phys. Rev. B 67, 205208-1-18 (May 2003).