Infrared photo-carrier radiometry of semiconductors: Physical principles, quantitative depth profilometry and scanning imaging of deep sub-surface electronic defects

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A. Mandelis, J. Batista and D. Shaughnessy, "Infrared photo-carrier radiometry of semiconductors: Physical principles, quantitative depth profilometry and scanning imaging of deep sub-surface electronic defects", Phys. Rev. B 67, 205208-1-18 (May 2003).

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