Investigation of H+ Implanted Silicon Wafers with Two-beam Cross-modulation Photocarrier Radiometry

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https://cadipt.mie.utoronto.ca/publications/investigation-of-h-implanted-silicon-wafers-with-two-beam-cross-modulation-photocarrier-radiometry/

Citation

J. Tolev and A. Mandelis, "Investigation of H+ Implanted Silicon Wafers with Two-beam Cross-modulation Photocarrier Radiometry", Proc. 14th Int. Conf. Photoacoustic & Photothermal Phenomena, January 6 – 9, 2007, European Physical Journal, Special Topics 153, 295 – 297 (2008).