Laser Infrared Photothermal Radiometric and ELYMAT Characterization of p-Si Wafers Annealed in the Presence of an External Electric Field

Permalink to Publication

https://cadipt.mie.utoronto.ca/publications/laser-infrared-photothermal-radiometric-and-elymat-characterization-of-p-si-wafers-annealed-in-the-presence-of-an-external-electric-field/

Citation

A. Mandelis, M. E. Rodriguez, Y. Raskin and V. Gorodokin, "Laser Infrared Photothermal Radiometric and ELYMAT Characterization of p-Si Wafers Annealed in the Presence of an External Electric Field", Phys. Stat. Sol. (a) 185 (2), 471-478 (2001).

PDF

View and Download