1. Home
  2. Publication
  3. Local-Stress-Induced Thermal Conductivity Anisotropy Analysis Using Non-Destructive Photo-Thermo-Mechanical Lock-in Thermography (PTM-LIT) Imaging

Local-Stress-Induced Thermal Conductivity Anisotropy Analysis Using Non-Destructive Photo-Thermo-Mechanical Lock-in Thermography (PTM-LIT) Imaging

H. Huan, A. Mandelis, L. Liu, and A. Melnikov - 2017

Permalink to Publication

https://cadipt.mie.utoronto.ca/publications/local-stress-induced-thermal-conductivity-anisotropy-analysis-using-non-destructive-photo-thermo-mechanical-lock-in-thermography-ptm-lit-imaging/

Citation

H. Huan, A. Mandelis, L. Liu, and A. Melnikov, “Local-Stress-Induced Thermal Conductivity Anisotropy Analysis Using Non-Destructive Photo-Thermo-Mechanical Lock-in Thermography (PTM-LIT) Imaging”, NDT&E Int. 91, 79-87 (2017). http://dx.doi.org/10.1016/j.ndteint.2017.06.008

PDF

View and Download