Lock-in carrierography non-destructive imaging of silicon wafers and silicon solar cells

https://cadipt.mie.utoronto.ca/publications/lock-in-carrierography-non-destructive-imaging-of-silicon-wafers-and-silicon-solar-cells/

P. Song, F. Yang., J-Y Liu, and A. Mandelis, “Lock-in carrierography non-destructive imaging of silicon wafers and silicon solar cells”, J. Appl. Phys. 128, 180903 (12 pages) (9 November 2020) https://doi.org/10.1063/5.0022852