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Measurement accuracy analysis of photocarrier radiometric determination of electronic transport parameters of silicon wafers

B. Li, D. Shaughnessy, and A. Mandelis - 2005

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https://cadipt.mie.utoronto.ca/publications/measurement-accuracy-analysis-of-photocarrier-radiometric-determination-of-electronic-transport-parameters-of-silicon-wafers/

Citation

B. Li, D. Shaughnessy, and A. Mandelis, "Measurement accuracy analysis of photocarrier radiometric determination of electronic transport parameters of silicon wafers", J. Appl. Phys. 97, 023701, 1-7 (2005).

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