Microelectronic Circuit Characterization via Photothermal Radiometry of Scribeline Recombination Lifetime

M. E. Rodriguez, A. Mandelis, G. Pan, J. A. Garcia, and Y. Riopel - 2001

Permalink to Publication

https://cadipt.mie.utoronto.ca/publications/microelectronic-circuit-characterization-via-photothermal-radiometry-of-scribeline-recombination-lifetime/

Citation

M. E. Rodriguez, A. Mandelis, G. Pan, J. A. Garcia, and Y. Riopel, "Microelectronic Circuit Characterization via Photothermal Radiometry of Scribeline Recombination Lifetime", Anal Sci. (J. Japan Soc. Anal. Chem.) 17 (Special Issue), s262 – s264 (2001).

Microelectronic Circuit Characterization via Photothermal Radiometry of Scribeline Recombination Lifetime

M. E. Rodriguez, A. Mandelis, G. Pan, J. A. Garcia and Y. Riopel - 2000

Permalink to Publication

https://cadipt.mie.utoronto.ca/publications/microelectronic-circuit-characterization-via-photothermal-radiometry-of-scribeline-recombination-lifetime/

Citation

M. E. Rodriguez, A. Mandelis, G. Pan, J. A. Garcia and Y. Riopel, "Microelectronic Circuit Characterization via Photothermal Radiometry of Scribeline Recombination Lifetime", Solid-State Electron. 44, 703-711 (2000).

PDF

View and Download