Non-Contacting Measurements of Photocarrier Lifetimes in Bulk- and Polycrystalline Thin-Film Si Photoconductive Devices by Photothermal Radiometry

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https://cadipt.mie.utoronto.ca/publications/non-contacting-measurements-of-photocarrier-lifetimes-in-bulk-and-polycrystalline-thin-film-si-photoconductive-devices-by-photothermal-radiometry/

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A. Mandelis, A. Othonos, C. Christofides and J. Boussey-Said, "Non-Contacting Measurements of Photocarrier Lifetimes in Bulk- and Polycrystalline Thin-Film Si Photoconductive Devices by Photothermal Radiometry", J. Appl. Phys. 80 (9), 5332-5341, November 1, 1996.

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