Optoelectronic transport property measurements of an amorphous silicon passivated c-silicon wafer using non-contacting methodologies

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Citation

A. Melnikov, B. Halliop, A. Mandelis and N. P. Kherani, "Optoelectronic transport property measurements of an amorphous silicon passivated c-silicon wafer using non-contacting methodologies", Thin Solid Films 520 (16), 5309–5313 (1 June 2012).

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