Permalink to Publication
https://cadipt.mie.utoronto.ca/publications/photo-carrier-radiometry-of-semiconductors-a-novel-powerful-optoelectronic-diffusion-wave-technique-for-silicon-process-non-destructive-evaluation/
Citation
A. Mandelis, "Photo-Carrier Radiometry of Semiconductors: A Novel Powerful Optoelectronic Diffusion-Wave Technique for Silicon Process Non-Destructive Evaluation", NDT&E International 39 (3), 244 – 252 (April 2006)