Photoacoustic Spectroscopy of Thin SiO2 Films Grown on (100) Si Substrates: A Thermal Interferometric Technique Complementary to Optical Interferometry

https://cadipt.mie.utoronto.ca/publications/photoacoustic-spectroscopy-of-thin-sio2-films-grown-on-100-si-substrates-a-thermal-interferometric-technique-complementary-to-optical-interferometry-3/

A. Mandelis, E. Siu and S. Ho, "Photoacoustic Spectroscopy of Thin SiO₂ Films Grown on (100) Si Substrates: A Thermal Interferometric Technique Complementary to Optical Interferometry", Appl. Phys. A. 33, 153 - 159, March, 1984.