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Photocarrier Radiometric Characterization of Electronic Transport Properties of High-Energy H+ Implanted Silicon Wafers

C. Wang , A. Mandelis , J. Tolev and J. Meijer - 2008

Permalink to Publication

https://cadipt.mie.utoronto.ca/publications/photocarrier-radiometric-characterization-of-electronic-transport-properties-of-high-energy-h-implanted-silicon-wafers/

Citation

C. Wang , A. Mandelis , J. Tolev and J. Meijer, "Photocarrier Radiometric Characterization of Electronic Transport Properties of High-Energy H+ Implanted Silicon Wafers", Proc. 14th Int. Conf. Photoacoustic & Photothermal Phenomena, January 6 – 9, 2007, European Physical Journal, Special Topics 153, 271 – 274 (2008).

Photocarrier Radiometric Characterization of Electronic Transport Properties of High-Energy H+ Implanted Silicon Wafers

C. Wang , A. Mandelis , J. Tolev and J. Meijer - 2008

Permalink to Publication

https://cadipt.mie.utoronto.ca/publications/photocarrier-radiometric-characterization-of-electronic-transport-properties-of-high-energy-h-implanted-silicon-wafers/

Citation

C. Wang , A. Mandelis , J. Tolev and J. Meijer, "Photocarrier Radiometric Characterization of Electronic Transport Properties of High-Energy H+ Implanted Silicon Wafers", Proc. 14th Int. Conf. Photoacoustic & Photothermal Phenomena, January 6 – 9, 2007, European Physical Journal, Special Topics 153, 271 – 274 (2008).