Permalink to Publication
https://cadipt.mie.utoronto.ca/publications/photothermal-rate-window-spectrometry-for-non-contact-bulk-lifetime-measurements-in-semiconductors/
Citation
Z.H. Chen, R. Bleiss, A. Mandelis and F. Shimura, "Photothermal Rate Window Spectrometry for Non Contact Bulk Lifetime Measurements in Semiconductors", J. Appl. Phys. 73, 5043-5048, May 1993.