Permalink to Publication
https://cadipt.mie.utoronto.ca/publications/quantitative-imaging-of-defect-distributions-in-cdznte-wafers-using-combined-deep-level-photo-thermal-spectroscopy-photocarrier-radiometry-and-lock-in-carrierography/
Citation
A. Melnikov, A. Mandelis, A. Sorala, C. Zavala-Lugo and M. Pawlak, "Quantitative Imaging of Defect Distributions in CdZnTe Wafers Using Combined Deep-Level Photo-Thermal Spectroscopy, Photocarrier Radiometry and Lock-In Carrierography" ACS Appl. Electon. Materials, 3, 2551-2563 (2021). https://doi.org/10.1021/acsaelm.1c00100