Permalink to Publication
https://cadipt.mie.utoronto.ca/publications/quantitative-lock-in-carrierographic-lifetime-imaging-of-silicon-wafers/
Citation
Q.-M. Sun, A. Melnikov and A. Mandelis, "Quantitative lock-in carrierographic lifetime imaging of silicon wafers" Appl. Phys. Lett. 101, 242107 (4 pages) (2012). Article chosen first among 5 "Research Highlights" and among the highest 20 downloads of this issue of Applied Physics Letters.