Permalink to Publication
https://cadipt.mie.utoronto.ca/publications/spectroscopic-photothermal-radiometry-as-a-deep-subsurface-depth-profilometric-technique-in-semiconductors/
Citation
D. Shaughnessy and A. Mandelis, "Spectroscopic photothermal radiometry as a deep subsurface depth profilometric technique in semiconductors", Rev. Sci. Instrum. 74 (1), 529 – 532 (January 2003).