Surface recombination velocity imaging of wet-cleaned silicon wafers using quantitative heterodyne lock-in carrierography

https://cadipt.mie.utoronto.ca/publications/surface-recombination-velocity-imaging-of-wet-cleaned-silicon-wafers-using-quantitative-heterodyne-lock-in-carrierography/

Q.M. Sun, A. Melnikov, A. Mandelis and R.H. Pagliaro, “Surface recombination velocity imaging of wet-cleaned silicon wafers using quantitative heterodyne lock-in carrierography”, Appl. Phys. Lett. 112, 012105 (5 pages) (2018). DOI: 10.1063/1.5003260