Surface recombination velocity on wet-cleaned silicon wafers using heterodyne lock-in carrierography imaging: Measurement uniqueness investigation

https://cadipt.mie.utoronto.ca/publications/surface-recombination-velocity-on-wet-cleaned-silicon-wafers-using-heterodyne-lock-in-carrierography-imaging-measurement-uniqueness-investigation/

P. Song, A. Melnikov, Q.M. Sun, R. Pagliaro, X. Sun, J.Y. Liu and A. Mandelis, “Surface recombination velocity on wet-cleaned silicon wafers using heterodyne lock-in carrierography imaging: Measurement uniqueness investigation", IOP Semiconductor Science and Technology 35, 055013 (5 pages) March 2020.