Temperature dependence of carrier mobility in FZ-Si wafers measured by infrared photo-carrier radiometry

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https://cadipt.mie.utoronto.ca/publications/temperature-dependence-of-carrier-mobility-in-fz-si-wafers-measured-by-infrared-photo-carrier-radiometry/

Citation

J. Batista, A. Mandelis and D. Shaughnessy, "Temperature dependence of carrier mobility in FZ-Si wafers measured by infrared photo-carrier radiometry", Appl. Phys. Lett. 82, 4077-4079 (9 June 2003).

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