Two-beam cross-modulation photocarrier radiometry. Principles and contrast amplification in semiconductor subsurface imaging

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https://cadipt.mie.utoronto.ca/publications/two-beam-cross-modulation-photocarrier-radiometry-principles-and-contrast-amplification-in-semiconductor-subsurface-imaging/

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D. Shaughnessy, A. Mandelis, J. Batista, J. Tolev and B. Li, "Two-beam cross-modulation photocarrier radiometry. Principles and contrast amplification in semiconductor subsurface imaging", Semicond. Sci. Technol. 320-334 21 (2006).

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