Permalink to Publication
https://cadipt.mie.utoronto.ca/publications/accuracy-of-photo-carrier-radiometric-measurements-of-electronic-transport-properties-of-ion-implanted-silicon-wafers/
Citation
B. Li, D. Shaughnessy, A. Mandelis, J. Batista and J. Garcia, "Accuracy of photo-carrier radiometric measurements of electronic transport properties of ion-implanted silicon wafers", J. Appl. Phys. 96 (1), 186 - 196 (1 July 2004).